Burn-in optimization under reliability and capacity restrictions : Dong-Hae Chi and Way Kuo. IEEE Trans. Reliab.38(2), 193 (1989)Microelectronics Reliability1990PDF133 KB
Software reliability and redundancy optimization : Dong-Hae Chi, Hsin-Hui Lin and Way Kuo. Proc. a. Reliab. Maintainab. Symp., 41 (1989)Microelectronics Reliability1990PDF256 KB
Maintainability for a manufacturing process : Way Kuo and Vicki Schluter. Proc. a. Reliab. Maintainab. Symp., 57 (1987)Microelectronics Reliability1987PDF124 KB
System effectiveness models: an annotated bibliography: F. A. Tillman, C. L. Hwang and Way Kuo. IEEE Trans. Reliab. R-29 (4), 295 (October 1980)Microelectronics Reliability1981PDF125 KB
Reliability enhancement through optimal burn-in : Way Kuo. IEEE Trans. Reliab. R-33, 145 (1984)Microelectronics Reliability1985PDF131 KB
Reliability cost in software life-cycle models : Hsin-Hui Lin and Way Kuo. Proc. a. Reliab. Maintainab. Symp., 364 (1987)Microelectronics Reliability1987PDF135 KB
Bayesian reliability and availability—a review : Frank A. Tillman, Way Kuo, C. L. Hwang and Doris Lloyd Grosh. IEEE Trans. Reliab.R-31 (4), 362 (1982)Microelectronics Reliability1983PDF127 KB
A review of error propagation analysis in systems : Way Kuo and V. R. R. Uppuluri. Microelectron. Reliab.23 (2) 235 (1983)Microelectronics Reliability1984PDF129 KB
Optimisation of systems reliability: by Frank A. Tillman, Ching-Lai Hwang and Way Kuo. Marcel Dekker Inc., New York, 1980. 311 pp.Evans · Reliability Engineering1982PDF101 KB
Simulation properties of the Bayesian and maximum likelihood estimators of availability : Way Kuo. Microelectron. Reliab. 24 (6) 1057 (1984)Microelectronics Reliability1986PDF137 KB
Optimization of systems reliability: Frank A. TILLMAN, Ching-Lai HWANG and Way Kuo Marcel Dekker, New York, 1980, ix + 311 pages, Sfr.112.00Hee · European Journal of Operational Research1983PDF88 KB
A- consecutive-k-out-of-n: G system: the mirror image of a consecutive-k-out-of-n: F system: Way Kuo, Weixing Zhang and Mingjian Zuo. IEEE Trans. Reliab.39(2), 244 (1990)Microelectronics Reliability1992PDF124 KB
