Organizational Behavior: Diversity in Organizations. Dr. M Samir Gopalan Silver Oak College of ManagementVivek Bodani
Applied Energy: P. Laxman Mani Kanta, M. Venkatesh, Satyesh Kumar Yadav, Bijoy Das, R. Gopalansatyesh
C. Gopalan, M. Chatterjee, ,Use of Growth Charts for Promoting Child Nutrition: A review of global experience (1985) From Nutrition Foundation of India,B-37, Gulmohar Park, New Delhi 110049, India Special publication series 2., 120 pp., softcover, write for pricing information.Seder · Journal of Nutrition Education1987PDF295 KB
Analyses of two difference 1-server systems : M. N. Gopalan. IEEE Trans. Reliab.R-25 (4), 280 (October 1976)Microelectronics Reliability1977PDF118 KB
A reliability physics model for parallel system : M. N. Gopalan and P. Venkateswarlu. Microelectron. Reliab.23 (2), 367 (1983)Microelectronics Reliability1984PDF152 KB
Reliability analysis of time-dependent cascade system with deterministic cycle times : M. N. Gopalan and P. Venkateswarlu. Microelectron. Reliab.22 (4), 841 (1982)Microelectronics Reliability1983PDF127 KB
Stochastic behaviour of a 2-unit system with 1-server subject to delayed maintenance : M. N. Gopalan and A. R. Saxena. Microelectron. Reliab. 17, 587 (1978)Microelectronics Reliability1979PDF123 KB
Busy-period analysis of a two-unit warm standby system with inspection time : R. Subramanyam Naidu and M. N. Gopalan. Microelectron. Reliab.23 (2), 341 (1983)Microelectronics Reliability1984PDF152 KB
Analysis of systems subject to inspection and repair: a state-of-the-art survey : R. Subramanyam Naidu and M. N. Gopalan. Microelectron. Reliab. 24, 939 (1984)Microelectronics Reliability1985PDF128 KB
Cost-benefit analysis of a two-unit cold standby system subject to slow switch : M. N. Gopalan, R. Radhakrishnan and A. Vijayakumar. Microelectron. Reliab. 24 (6), 1019 (1984)Microelectronics Reliability1986PDF265 KB
S-expected Number of Inspections and Repairs of a One-server N-unit System Subject to Random Inspection: R. Subramanyam Naidu and M. N. Gopalan. Microelectron. Reliab.24, 379 (1984)Microelectronics Reliability1985PDF128 KB
Cost-benefit analysis of a 1-server n-unit system subject to general repair and inspection: R. Subramanyam Naidu and M. N. Gopalan. Microelectron. Reliab.23 (3), 531 (1983)Microelectronics Reliability1984PDF120 KB
Probabilistic analysis of a 2-unit cold-standby system with a single repair facility : S. K. Srinivasan and M. N. Gopalan. IEEE Trans. Reliab.R-22, 250 (Ded. 1973)Microelectronics Reliability1974PDF107 KB
Cost-benefit Analysis of a One-server Two-unit System Subject to Two Types of Failure : R. Subramanyam Naidu and M. N. Gopalan. Microelectron. Reliab.23 (3), 441 (1983)Microelectronics Reliability1984PDF250 KB
