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About this Engineering article
s-expected number of inspections and repairs of a one-server n-unit system subject to random inspection: R. Subramanyam Naidu and M. N. Gopalan. Microelectron. Reliab.24, 379 (1984) is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
- Published
- 1985
- Language
- EN
- Field
- Engineering (Physical Sciences)