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16 works

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BOOKS

Books

2 total

iec

tkofalow

IEC 61850 Demystified

Herbert Falk

2019

JOURNALS & PAPERS

Journals & papers

7 total

IEC-62305-2

IEC

IEC-62305-1

IEC

IEC 60357 ed3.0

IEC

2010

IEC-62305-3

International Electrotechnical Commission

2010

IEC Standard Frequencies

British Standards Institute Staff

2009

IEC Nanoelectronics Standardization Roadmap

JAYNE BROOKS

2013

IEC 60038-2021 IEC Standard Voltages

IEC

2021

DOCUMENTS · SCRIBD

Documents

12 total

IEC

Shamila Wijayasekara

IEC 61215 - IEC 61730

IEC 62351 - Cybersecurity For IEC 61850 - IEC 61850

Matthew Sum

IEC 82304 Vs IEC 62304

Martin Nieuwoudt

Asw30k-Lt-G3 Iec 61727 - Iec 61683 - Iec 62116

Nanna Alencar

7sa522 Iec

dobathinh

Iec 61779

Nazanin Akram

RESEARCH ARTICLES

Research articles

11 total

IEC

IEEE

IEEE1985

DOI 10.1109/mper.1985.5526615

IEC Newsletter

Elsevier Science

Elsevier Science1976

DOI 10.1016/0091-2182(76)90082-3

IEC News

IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0272-1724)

IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0272-1724)1982

DOI 10.1109/mper.1982.5519953

IEC Standards

Institution of Electrical Engineers

Institution of Electrical Engineers1986

DOI 10.1049/jiere.1986.0062

IEC News

IEEE

IEEE1982

DOI 10.1109/mper.1982.5520248

IEC-Steckvorrichtungssystem

Legacy

Wiley (John Wiley & Sons); Wiley (ISSN 0031-9279)1976

DOI 10.1002/phbl.19760320911

IEC Standards

Elsevier Science; Elsevier; Sichuan Society for Biomedical Engineering; Elsevier BV (ISSN 0141-5425)

Elsevier Science; Elsevier; Sichuan Society for Biomedical Engineering; Elsevier BV (ISSN 0141-5425)1980

DOI 10.1016/0141-5425(80)90174-0

IEC Standards

Institution of Electrical Engineers

Institution of Electrical Engineers1985

DOI 10.1049/jiere.1985.0068

IEC News

IEEE

IEEE1982

DOI 10.1109/mper.1982.5519440

IEC News

IEEE

IEEE1981

DOI 10.1109/mper.1981.5511883

IEC News

IEEE

IEEE1981

DOI 10.1109/mper.1981.5511816