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2006 IEEE International Integrated Reliability Workshop Final Report - Experimental Study of Temperature Dependence of Program/Erase Endurance of Embedded Flash Memories with 2T-FNFN Device ArchitectureTao · pages 76-792006PDF434 KB
2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Characterization and Modeling of Program/erase Induced Device Degradation in 2T-FNFN-NOR Flash MemoriesTao et al. · pages 1-52008PDF288 KB
2016 International Conference on Computation System and Information Technology for Sustainable Solutions (CSITSS) - Multi Mobile Agent itinerary planning using Farthest Node First Nearest Node Next (FNFNNN) techniqueB et al.2016PDF967 KB
