2020 IEEE International Electron Devices Meeting (iedm)
Tokei, Zs., Vega, V., Murdoch, G., O'Toole, M., Croes, K., Baert, R., Veen, M. Van der, Adelmann, C., Soulie, J. P., Boemmels, J., Wilson, Park, S. H., Sankaran, Pourtois, Sweerts, Paolillo, S., Decoster, Mao, Lazzarino, F., Versluijs, Blanco, Ercken, Kesters, E., Le, Q-T., Holsteyns, Heylen, N., Teugels, L., Devriendt, Struyf, H., Morin, P., Jourdan, Elshocht, S. Van, Ciofi, I., Gupta, A., Zahedmanesh, Vanstreels, Na, M. H.
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