Resumen bibliográfico, 1960-84 / Edelberto Torres-Rivas, María Eugenia Gallardo.Edelberto. Torres-Rivas1985ES
Crater Edge Profling of Ni/Cr Sandwich Multilayer Thin Films by Scanning Auger Microscopy (sam)Zalar · Surface and Interface Analysis1980PDF345 KB
Reactions of Metal Ions at Fluorinated SAM (Self-Assembled Monolayer) Surfaces: Formation of MFn+ (M = Ti, Cr, Fe, Mo, and W; n = 1-5)Pradeep · Journal of the American Chemical Society1994PDF1.5 MB
2012 IEEE 7th Sensor Array and Multichannel Signal Processing Workshop (SAM) - Power allocation for MIMO-OFDM based CR with spatial constraints and CSI uncertaintyPratibha et al.2012PDF235 KB