X-ray lithography: R. K. Watts. Solid St. Technol. p. 68 (May 1979)Microelectronics Reliability1980PDF115 KB
X-ray lithography: R. K. Watts Solid St. Technol. p. 68 (May 1979)Microelectronics Journal1981PDF134 KB
R. K. Watts: Point Defects in Crystals. John Wiley & Sons, New York, London, Sidney, Toronto 1977. 312 Seiten, Preis: £ 16.50, $ 27.90.Lehmann · Zeitschrift für Elektrochemie und angewandte physikalische Chemie1978PDF270 KB
A review of fine-line lithographic techniques: present and future: R. K. Watts and J. H. Bruning. Solid St. Technol. p. 99 (May 1981)Microelectronics Reliability1982PDF119 KB
VLSI electronics — Microstructure science: Edited by:- Norman G. Einspruch and R.K. Watts Publishers: Academic Press, Inc., 1250 Sixth Avenue, San Diego, CA 92101, United States of America Price: US $ 69.00. (ISBN 0-12-234116-3) Published 1987G.W.A.D. · Microelectronics Reliability1988PDF96 KB
