Family histories and genealogies. A series of genealogical and biographical monographs on the families of MacCurdy, Mitchell, Lord, Lynde, Digby, Newdigate, Hoo, Willoughby, Griswold, Wolcott, Pitkin, Ogden, Johnson, Diodati, Lee and Marvin, and notes on the families of Buchanan, Parmelee, Boardman, Lay, Locke, Cole, De Wolf, Drake, Bond and Swayne, Dunbar and Clarke, and a notice of Chief…Edward Elbridge Salisbury1892EN
System reliability analysis: A tutorial : Mitchell O. Locks. Microelectron. Reliab.18, 335 (1978)Microelectronics Reliability1979PDF95 KB
A minimizing algorithm for sum of disjoint products : Mitchell O. Locks. IEEE Trans. Reliab.R-36, 445 (1987)Microelectronics Reliability1989PDF136 KB
Recent developments in computing of system-reliability : Mitchell O. Locks. IEEE Trans. Reliab.R-34(5), 425 (1985)Microelectronics Reliability1987PDF93 KB
Note on disjoint products algorithms : Mitchell O. Locks and J. M. Wilson. IEEE Trans. Reliab. 41, 81 (1992)Microelectronics Reliability1992PDF134 KB
Anomalies in interpreting a fault tree : Mitchell O. Locks. IEEE Transactions on Reliability, 42(2), 314 (June 1993)Microelectronics Reliability1994PDF109 KB
Modularizing, minimizing, and interpreting the K&H fault-tree : Mitchell O. Locks. IEEE Trans. Reliab.R-30 (5), 411 (1981)Microelectronics Reliability1983PDF262 KB
Recursive disjoint products, inclusion-exclusion and min-cut approximations : Mitchell O. Locks. IEEE Trans. Reliab.R-29 (5) 368 (December 1980)Microelectronics Reliability1981PDF123 KB
Synthesis of fault trees: an example of noncoherence: Mitchell O. Locks. IEEE Trans. Reliab., R-28, (1) 2 (April 1979)Microelectronics Reliability1980PDF124 KB
The fail-safe feature of the Lapp & Powers fault tree : Mitchell O. Locks. IEEE Trans. Reliab.R-29, (1) 10 (April 1980)Microelectronics Reliability1980PDF133 KB
Evaluating the KTI Monte Carlo method for system reliability calculations: Mitchell O. Locks. IEEE Trans. Reliab., R-28, (5) 368 (December 1979)Microelectronics Reliability1980PDF123 KB
Maintainability and life cycle costing : Mitchell O. Locks. Proc. IEEE A. Reliab. Maintainab. Symp., Los Angeles, 17–19 January 1978, p. 251Microelectronics Reliability1978PDF259 KB
Inverting and minimizing Boolean functions, minimal paths and minimal cuts: noncoherent system analysis: Mitchell O. Locks. IEEE Trans. Reliab., R-28, (5) 373 (December 1979)Microelectronics Reliability1980PDF242 KB