Managing a farm Sherman E. Johnson, Neil W. Johnson, Martin R. Cooper ...United States. Bureau of agricultural economics. Division of farm management and costs.1946
Toxicity of Insecticides and Acaricides to the Papaya, Carica Papaya L. / Martin Sherman and Minoru Tamashiro.Martin Sherman1959
Sienna OPS5 Student Version to Accompany Sherman/Martin, An OPS5 Primer, Introduction to Rule-based Expert SystemsPorter D Sherman, John C Martin, Inference Engine Technologies1990PDF7.8 MB
Learning on the move; a guide for migrant education. Edited by Neil W. Sherman and Alfred M. Potts, 2d. Illus. by Elizabeth Martin.Workshop on Curriculum for Migratory Children (1959 : Adams State College)1960
Error probabilities for maximum likelihood detection of M-ary Poisson processes in Poisson noise / Sherman Karp, Martin G. Hurwitz, Robert M. Gagliardi.Sherman. Karp1968
Software Engineering, Martin L. Shooman, Mcgraw Hill Book Company, 1983. No. of Pages: 683Harris · Quality and Reliability Engineering International1985PDF267 KB
Independence bounds and approximations for system availability computations : Martin L. Shooman. Proc. A. Reliab. Maintainab. Symp. 115 (1985)Microelectronics Reliability1985PDF133 KB
Software engineering: Martin L. Shooman McGraw-Hill Book Company, Berkshire, UK, 682pp, £27.95, ISBN 0-07-057021-3Advances in Engineering Software (1978)1983PDF117 KB
Reliability of shuttle mission control center software : Martin L. Shooman and George Richeson. Proc. A. Reliab. Maintainab. Symp. 125 (1983)Microelectronics Reliability1984PDF134 KB
Simplification of Markov models by state merging : Martin L. Shooman and Arthur E. Laemmel. Proc. a. Reliab. Maintainab. Symp., 159 (1987)Microelectronics Reliability1987PDF133 KB
A many-state Markov model for computer software performance parameters : Martin L. Shooman and Ashok K. Trivedi. IEEE Trans. Reliab.R-25 (2), 66 (1976)Microelectronics Reliability1976PDF134 KB
Reliability of Computer Systems and Networks: Fault Tolerance, Analysis and Design; Martin L. Shooman. John Wiley and Sons Inc., New York; 2002. Hardcover, pp. 528, plus XXII.Stojcev · Microelectronics Reliability2004PDF210 KB
Generation of reliability and safety data by analysis of expert opinions : Martin L. Shooman and Sharad Sinkar. Proc. IEEE Reliab. Maintainab. Symp., Philadelphia (Jan. 18–20, 1977) p. 186Microelectronics Reliability1977PDF135 KB
A Technical Report on Analytical-experimental Correlation of Radiation Loss from an Argon Arcjet. Prepared by Martin P. Sherman, Research Assistant Paul F. Jacobs, Assistant in Research.Princeton University. Guggenheim Laboratories for the Aerospace Propulsion Sciences.1963EN
