Pour une sociologie du romanby L. Goldmann;Problèmes d'une sociologie du roman, Revue de l'Institut de Sociologie Solvay, no 2by L. GoldmannBARTHES · Presses Universitaires de France1964PDF305 KB
Man in Marxist Theory and the Psychology of Personality. By Lucien Sève. (Pp. 508; illustrated; £16.50.) Harvester Press: Hassocks, Sussex. 1978.Freudianism: a Marxist Critique. By V. N. Vološinov. (Pp. 153; £7.80.) Academic Press: London. 1976.Cultural Creation. By L. Goldmann. (Pp. 173; £7.00.) Basil Blackwell: Oxford. 1977.Psychological Medicine1979PDF198 KB
Tome IX, L'univers économique et socialby Encyclopédie Française;Tome XX, Le monde en devenir, (histoire, évolution, prospective)by Encyclopédie Française;L'economia del XX secoloby F. Perroux;Dynamique et structures. La méthode structurale comme fondement de l'analyse dynamique en économieby J.-P. Mockers;Tempo e relazioneby E. Paci;Entretiens sur les notions de genèse et de structureby M. De…Ag. · Giornale degli Economisti1969PDF533 KB
Goldmanns Großer Weltatlasby L. Visintin; H. Bayer; W. GoldmannSchmidt-Kraepelin · Erdkunde1966PDF291 KB
Radial distortion in cambered wafers: L. S. Goldmann, Solid-St. Technol. 74 (June 1979)Microelectronics Reliability1980PDF110 KB
Radial distortion in cambered wafers: L. S. Goldmann Solid-State Technol. 74 (June 1979)Microelectronics Journal1981PDF129 KB
Geometric optimization of controlled collapse interconnections : L. S. Goldmann, IBM J. Res. Dev. 13, No. 3, May (1969), p. 251Microelectronics Reliability1970PDF97 KB
Optimizing cyclic fatigue life of controlled collapse chip joints : L. S. Goldmann, Proc. 1969 Electron. Compon. Conf., Washington D.C., 30 April–2 May (1969), p. 404Microelectronics Reliability1970PDF92 KB
Lead-indium for controlled-collapse chip joining: L. S. Goldmann, R. J. Herdzik, N. G. Koopman and V. C. Marcotte Proc. Electron. Components Conf., Arlington, Va., p.25 (May 1977)Microelectronics Journal1979PDF152 KB
Lead-indium for controlled-collapse chip joining : L. S. Goldmann, R. J. Herdzik, N. G. Koopman and V. C. Marcotte. Proc. Electron. Components Conf. Arlington, Va., May 16–18 1977. p. 25Microelectronics Reliability1977PDF132 KB
