Error prediction in software : Inder M. Soi and Krishna Gopal. Microelectron. Reliab.18, 433 (1978)Microelectronics ReliabilityMicroelectronics Reliability1979DOI 10.1016/0026-2714(79)90020-9
Some aspects of reliable software packages : Inder M. Soi and Krishna Gopal. Microelectron. Reliab.19, 379 (1979)Elsevier ScienceElsevier Science1980DOI 10.1016/0026-2714(80)90081-5
Detection and diagnosis of software malfunctions : Inder M. Soi and Krishna Gopal. Microelectron. Reliab.18, 353 (1978)Elsevier ScienceElsevier Science1979DOI 10.1016/0026-2714(79)90022-2
Hardware vs software reliability—a comparative study: Inder M. Soi and Krishna Gopal. Microelectron. Reliab. 20, 881 (1980)Elsevier ScienceElsevier Science1982DOI 10.1016/0026-2714(82)90102-0
A new method for reliability optimization : Krishna Gopal, K. K. Aggarwal and J. S. Gupta. Microelectron. Reliab. 17, 605 (1978)Elsevier ScienceElsevier Science1979DOI 10.1016/0026-2714(79)90199-9
Reliability analysis of multistate device networks : Krishna Gopal, K. K. Aggarwal and J. S. Gupta. IEEE Trans. Reliab.R-27, (3) 233 (August 1978)Elsevier ScienceElsevier Science1978DOI 10.1016/0026-2714(78)90046-x
An improved algorithm for reliability optimization : Krishna Gopal, K. K. Aggarwal and J. S. Gupta. IEEE Trans. Reliab.R-27, (5) 325 (December 1978)Elsevier ScienceElsevier Science1979DOI 10.1016/0026-2714(79)90392-5
Reliability optimization in systems with many failure modes : Krishna Gopal, K. K. Aggarwal and J. S. Gupta. Microelectron. Reliab.18, 423 (1978)Elsevier ScienceElsevier Science1979DOI 10.1016/0026-2714(79)90021-0
A heuristic method for optimum redundancy allocation in non-coherent systems : Krishna Gopal and Jai Bhagwan Mudgal. Microelectron. Reliab.24, 401 (1984)Elsevier ScienceElsevier Science1985DOI 10.1016/0026-2714(85)90082-4
An effecient algorithm for computing global reliability of a network : S. P. Jain and Krishna Gopal. IEEE Trans. Reliab. 37(5), 488 (December 1988)Elsevier ScienceElsevier Science1990DOI 10.1016/0026-2714(90)90087-4
Recursive algorithm for reliability evaluation of k-out-of-n: G system: S. P. Jain and Krishna Gopal. IEEE Trans. Reliab.R-34 (2) 144 (1985)Elsevier ScienceElsevier Science1986DOI 10.1016/0026-2714(86)90099-5
A new approach to reliability optimization in general modular redundant systems : Krishna Gopal, K. K. Aggarwal and J. S. Gupta. Microelectron. Reliab.18, 419 (1978)Elsevier ScienceElsevier Science1979DOI 10.1016/0026-2714(79)90024-6