Reply to Letters of M. Tanemura and E. M. Tory and D. K. PickardWeiner · Applied Probability Trust1979PDF263 KB
Conduction of beam deposited electrons through thin SiO2 films : K. A. Pickar, Solid-St. Electron. 13 (1970), p. 303Microelectronics Reliability1970PDF50 KB
Range and straggle of boron in photoresist : G. Baccarani and K. A. Pickar. Solid St. Electron. 15 (1972), p. 239Microelectronics Reliability1972PDF112 KB
Monoamine metabolite interactions in schizophrenia : John K. Hsiao, John J. Bartko, Allen R. Doran, Allan Breier, William Z. Potter, David Pickar National Institute of Mental Health, Bethesda, MD 20892Biological Psychiatry1990PDF102 KB
Carrier transport and storage effects in Au ion implanted SiO2 structures : L. I. Chen, K. A. Pickar and S. M. Sze. Solid St. Electron. 15 (1972), p. 979Microelectronics Reliability1973PDF115 KB
