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BOOKS

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Joseph Smith : Rough Stone Rolling

Richard Lyman Bushman

RESEARCH ARTICLES

Research articles

5 total

Review: The Go-Between by Joseph Losey, John Heyman, Norman Priggen

Jordan · Film Quarterly

Book Review: Electronics Reliability and Measurement Technology—Non-Destructive Evaluation. Edited by Joseph S. Heyman

Reiner · Angewandte Chemie International Edition in English

Electronics reliability and measurement technology–non-destructive evaluation. Edited by Joseph S. Heyman, Noyes Publications, 1988, xii, 188 pp., bound, $ 39.–. ISBN 0-8155-1171-X

Reiner · Advanced Materials

Review of: “ELECTRONICS RELIABILITY AND MEASUREMENT TECHNOLOGY - NONDESTRUCTIVE EVALUATION” Edited by Joseph S. Heyman, Noyes Data Corporation, Noyes Publications, New Jersey, December 15, 1988. (Based on a Workshop held at NASA Langley Research Center, June 1986) xii plus 128 pages, $39.

C.A.H. et al. · Nondestructive Testing Communications

Electronics reliability and measurement technology: Nondestructive Evaluation Author: Joseph S. Heyman Publishers: Noyes data corporation, Noyes Publications, Publicity Department, Mill Road at Grand Avenue, Park Ridge, New Jersey 07656, United States of America. Price: $ 39.00. (ISBN 0-8155-1171-X). Published 1988

G.W.A.D. · Microelectronics Reliability

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