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Structure and chemical analysis in thin films by in situ IR ellipsometry by Karsten Hinrichs; Guoguang Sun; Jörg Rappich; Andreas Furchner is a book available to read on EtoBox.

What is Structure and chemical analysis in thin films by in situ IR ellipsometry about?

In 2007, infrared spectroscopic ellipsometry (IRSE) was introduced as a highly sensitive technique for in situ investigations of chemical and structural changes in thin polymer films. In this initial publication, the response of a mixed polyelectrolyte brush film in liquid environments was studied upon external pH stimuli. In the following decade, a variety of solid–liquid interfaces such as various types of thin polymer and oligomer thin films including possible electrochemical preparations were investigated. Typically, these studies were motivated by respective applications of the films in optoelectronic devices, sensors or biofunctional interfaces. In 2017, in situ IRSE was brought to a new level by showing the capability for sensitive and quantitative intra- and intermolecular interaction studies of thin thermoresponsive polymer films. Recently, new applications became available by the involvement of laser sources as well as by specifically designed microfluidic cells. These two issues are described in other chapters of this Encyclopedia. In the chapter “Hyperspectral and time-resolved IR laser polarimetry”, new possibilities of laser-based IR polarimetry regarding highly time-

Author
Karsten Hinrichs; Guoguang Sun; Jörg Rappich; Andreas Furchner
Publisher
Elsevier - Health Sciences Division
Published
2024
Language
EN
ISBN
9780323856706

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