Can I read On-Line Testing for VLSI (Frontiers in Electronic Testing, 11) on EtoBox?

On-Line Testing for VLSI (Frontiers in Electronic Testing, 11) by M. Nicolaidis, Y. Zorian (auth.), Michael Nicolaidis, Yervan Zorian, Dhiraj K. Pradan (eds.) is a nonfiction available to read on EtoBox.

What is On-Line Testing for VLSI (Frontiers in Electronic Testing, 11) about?

Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as __on-line testing__. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. __On-Line Testing for VLSI__ contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent __IEEE International____On-Line Testing Workshops__. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. __On-Line Testing for VLSI__ is an edited volume of original research comprising invited contributions by leading researchers.

Who reads On-Line Testing for VLSI (Frontiers in Electronic Testing, 11)?

Author

M. Nicolaidis, Y. Zorian (auth.), Michael Nicolaidis, Yervan Zorian, Dhiraj K. Pradan (eds.)

Publisher

Springer US

Published

1998

Language

EN

ISBN

9781475760699

Category

nonfiction

Subjects

Engineering, Computer Science, Stem