Can I read Delay Fault Testing for VLSI Circuits (Frontiers in Electronic Testing, 14) on EtoBox?

Delay Fault Testing for VLSI Circuits (Frontiers in Electronic Testing, 14) by Angela Krstić, Kwang-Ting Cheng (auth.) is a nonfiction available to read on EtoBox.

What is Delay Fault Testing for VLSI Circuits (Frontiers in Electronic Testing, 14) about?

In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly. With improvements in the semiconductor process technology, our expectations on speed have soared. A frequently asked question in the last decade has been how fast can the clock run. This puts significant demands on timing analysis and delay testing. Fueled by the above events, a tremendous growth has occurred in the research on delay testing. Recent work includes fault models, algorithms for test generation and fault simulation, and methods for design and synthesis for testability. The authors of this book, Angela Krstic and Tim Cheng, have personally contributed to this research. Now they do an even greater service to the profession by collecting the work of a large number of researchers. In addition to expounding such a great deal of information, they have delivered it with utmost clarity. To further the reader's understanding many key concepts are illustrated by simple examples. The basic ideas of delay testing have reached a level of maturity that makes them suitable for practice. In

Who reads Delay Fault Testing for VLSI Circuits (Frontiers in Electronic Testing, 14)?

Author

Angela Krstić, Kwang-Ting Cheng (auth.)

Publisher

Springer Science+Business Media, LLC

Published

1998

Language

EN

ISBN

9780792382959

Category

nonfiction

Subjects

Computer Science, Engineering, Stem