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Can I read Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A on EtoBox?

Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A by J. R Lloyd; Frederick G Yost; P. S Ho; Materials Research Society; MRS Symposium on Materials Reliability Issues in Microelectronics is a book available to read on EtoBox.

What is Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A about?

<p>With the increased complexity of modern integrated circuits, it is important that reliability problems be attacked properly with the appropriate tools. This volume recognizes that almost all reliability problems are materials problems, and helps to put 'reliabilty physics' on a firm scientific foundation. Topics include: electromigration; stress effects on reliability; stress and packaging; metallization; device, oxide and dielectric reliability; new investigative techniques; corrosion.</p>

Author
J. R Lloyd; Frederick G Yost; P. S Ho; Materials Research Society; MRS Symposium on Materials Reliability Issues in Microelectronics
Publisher
Cambridge University Press
Published
1991
Language
EN
ISBN
9781558991194
Subjects
Engineering, Technology, Stem

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