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Can I read Materials reliability issues in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A on EtoBox?
Materials reliability issues in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A by Anthony S Oates; Materials Research Society Spring Meeting (1995 : San Francisco, Calif) is a engineering available to read on EtoBox.
What is Materials reliability issues in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A about?
This long-standing proceedings series is highly regarded as a premier forum for the discussion of microelectronics reliability issues. In this fifth book, emphasis is on the fundamental understanding of failure phenomena in thin-film materials. Special attention is given to electromigration and mechanical stress effects. The reliability of thin dielectrics and hot carrier degradation of transistors are also featured. Topics include: modeling and simulation of failure mechanisms; reliability issu
Who reads Materials reliability issues in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A?
It is typically read by working professionals who need an authoritative practice reference.
Common subject areas: medicine, law, business, engineering.
- Author
- Anthony S Oates; Materials Research Society Spring Meeting (1995 : San Francisco, Calif)
- Publisher
- Pittsburgh, Penn.: Materials Research Society
- Published
- 1995
- Language
- EN
- ISBN
- 9781558992948
- Category
- engineering
- Subjects
- Engineering, Mathematics, Technology
- Updated
- 2026-03-25
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