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About this book
Defect-concentration dependence of electrical transport mechanisms in CuO nanowires by Zufang Lin & Runze Zhan & Luying Li & Huihui Liu & Shuangfeng Jia & Huanjun Chen & Shuai Tang & Juncong She & Shaozhi Deng & Ningsheng Xu & Jun Chen is a book available to read on EtoBox.
- Author
- Zufang Lin & Runze Zhan & Luying Li & Huihui Liu & Shuangfeng Jia & Huanjun Chen & Shuai Tang & Juncong She & Shaozhi Deng & Ningsheng Xu & Jun Chen
- Publisher
- Royal Society of Chemistry
- Published
- 2018
- Language
- EN
More by Zufang Lin & Runze Zhan & Luying Li & Huihui Liu & Shuangfeng Jia & Huanjun Chen & Shuai Tang & Juncong She & Shaozhi Deng & Ningsheng Xu & Jun Chen
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