Skip to content

Opening book details…

About this book

Dependence of defect structure on In concentration in InGaN epilayers grown on AlN/Si(111) substrate by Arun Malla Chowdhury & Deependra Kumar Singh & Basanta Roul & K. K. Nanda & S. B. Krupanidhi is a book available to read on EtoBox.

Author
Arun Malla Chowdhury & Deependra Kumar Singh & Basanta Roul & K. K. Nanda & S. B. Krupanidhi
Publisher
Royal Society of Chemistry
Language
EN

More by Arun Malla Chowdhury & Deependra Kumar Singh & Basanta Roul & K. K. Nanda & S. B. Krupanidhi

Browse all works by Arun Malla Chowdhury & Deependra Kumar Singh & Basanta Roul & K. K. Nanda & S. B. Krupanidhi

Similar books