Can I read Multi-Chip Module Test Strategies on EtoBox?

Multi-Chip Module Test Strategies by Yervant Zorian, V. D. Agrawal (auth.), Yervant Zorian (eds.) is a nonfiction available to read on EtoBox.

What is Multi-Chip Module Test Strategies about?

MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. __Multi-Chip Module Test Strategies__ presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. __Multi-Chip Module Test Strategies__ consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. __Multi-Chip Module Test Strategies__ has also been published as a special issue of the __Journal of Electronic Testing: Theory and Applications__ (JETTA, Volume 10, Numbers 1 and 2).

Who reads Multi-Chip Module Test Strategies?

Author

Yervant Zorian, V. D. Agrawal (auth.), Yervant Zorian (eds.)

Publisher

Springer Science+Business Media, LLC

Published

1997

Language

EN

ISBN

9781461561071

Category

nonfiction

Subjects

Engineering, Stem