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Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact (Springer Series in Materials Science, 270) by Cor L Claeys; Eddy Simoen is a engineering available to read on EtoBox.
What is Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact (Springer Series in Materials Science, 270) about?
This book provides a unique review of various aspects of metallic contamination in Si and Ge-based semiconductors. It discusses all of the important metals including their origin during crystal and/or device manufacturing, their fundamental properties, their characterization techniques and their impact on electrical devices’ performance. Several control and possible gettering approaches are addressed. The book offers a valuable reference guide for all researchers and engineers studying advanced
Who reads Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact (Springer Series in Materials Science, 270)?
It is typically read by working professionals who need an authoritative practice reference.
Common subject areas: medicine, law, business, engineering.
- Author
- Cor L Claeys; Eddy Simoen
- Publisher
- Springer International Publishing
- Published
- 2018
- Language
- EN
- ISBN
- 9783319939247
- Category
- engineering
- Subjects
- Engineering, Science, Physics
- Updated
- 2026-03-25
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