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Extreme Statistics in Nanoscale Memory Design (Integrated Circuits and Systems) by Amith Singhee (auth.), Amith Singhee, Rob A. Rutenbar (eds.) is a engineering available to read on EtoBox.
What is Extreme Statistics in Nanoscale Memory Design (Integrated Circuits and Systems) about?
Knowledge exists: you only have to ?nd it VLSI design has come to an important in?ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the manufacturing process, simulation-based design essentially becomes useless, since its predictions will be far from the reality of manufactured ICs. On the other hand, using design margins based on some traditional notion of worst-case sc
Who reads Extreme Statistics in Nanoscale Memory Design (Integrated Circuits and Systems)?
It is typically read by working professionals who need an authoritative practice reference.
Common subject areas: medicine, law, business, engineering.
- Author
- Amith Singhee (auth.), Amith Singhee, Rob A. Rutenbar (eds.)
- Publisher
- Springer US
- Published
- 2010
- Language
- EN
- ISBN
- 9781441966063
- Category
- engineering
- Subjects
- Technology, Computer Science, Engineering
- Updated
- 2026-03-25
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