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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Devices, Circuits, and Systems) by Krishnendu, Chakrabarty ;Sandeep, K. Goel (editor) is a nonfiction available to read on EtoBox.

What is Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Devices, Circuits, and Systems) about?

This title covers common problems in areas such as process variation, power supply, noise, crosstalk, resistive opens/bridges and design-for-manufacturing (DiM)-related rule violations. Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The book also addresses testing for small-delay defects (SDDs), which can cause immediate timing failures on both critical and non-critical paths in the circuit. Overviews semiconductor industry test challenges and the need for SDD testing, including basic concepts and introductory material Describes algorithmic solutions incorporated in commercial tools from Mentor Graphics Reviews SDD testing based on "alternative methods" that explores new metrics, top-of

Who reads Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Devices, Circuits, and Systems)?

Author

Krishnendu, Chakrabarty ;Sandeep, K. Goel (editor)

Publisher

CRC Press, Taylor & Francis Group

Published

2017

Language

EN

ISBN

9780367837389

Category

nonfiction

Subjects

Engineering, Technology, Stem