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About this book
Scanning Electron Microscopy : Proceedings of the 10Th Annual Scanning Electron Microscope Symposium and Workshops on Materials and Component Characterization/quality Control with the Sem/stem by Om Johari; IIT Research Institute; Scanning Electron Microscope Symposium is a book available to read on EtoBox.
- Author
- Om Johari; IIT Research Institute; Scanning Electron Microscope Symposium
- Publisher
- Chicago: Metals Research Division, IIT Research Institute
- Published
- 1979
- Language
- EN
- ISBN
- 9780915802111
- Subjects
- Engineering, Technology, Stem
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