About this scholarly article

P‐182: A Numerical Analysis of Current Efficiency Hump at Low Grey in the OLED Devices by Cho, Hyung Uk; Kim, Bo Woon; Lee, Jun Young; Cho, Young Mi; Baek, Seung In; Kim, Yong Jo is a scholarly article available to read on EtoBox.

Author

Cho, Hyung Uk; Kim, Bo Woon; Lee, Jun Young; Cho, Young Mi; Baek, Seung In; Kim, Yong Jo

Publisher

Wiley (John Wiley & Sons); Wiley (ISSN 0003-966X)

Published

2020