About this scholarly article

2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - External (transient) latchup phenomenon investigated by optical mapping (TIM) technique by Domanski, Krzysztof; Heer, Michael; Esmark, Kai; Pogany, Dionyz; Stadler, Wolfgang; Gornik, Erich is a scholarly article available to read on EtoBox.

Author

Domanski, Krzysztof; Heer, Michael; Esmark, Kai; Pogany, Dionyz; Stadler, Wolfgang; Gornik, Erich

Publisher

IEEE

Published

2007

Language

EN