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Low Loss Compact and Fabrication Tolerant Si Wire Waveguide Bend Using Clothoid and Normal Curves For Large Scale Photonic Integrated Circuits by renan.moreirasubs is a document available to read on EtoBox.
What is Low Loss Compact and Fabrication Tolerant Si Wire Waveguide Bend Using Clothoid and Normal Curves For Large Scale Photonic Integrated Circuits about?
A novel low-loss 90° waveguide bend using clothoid and normal curves is proposed for photonic integrated circuits, achieving a significant reduction in bending loss. The optimal ratio of clothoid curves was identified, resulting in a bending loss of 0.002 dB/90° for a radius of 4 μm, which is ten times lower than traditional bends. This design enhances fabrication tolerance and maintains the same footprint as conventional bends, making it suitable for large-scale applications.
- Author
- renan.moreirasubs
- Language
- EN