About this scholarly article

A comprehensive investigation of silicon film thickness ( T SI ) of nanoscale DG TFET for low power applications by Ranjan, Rajeev; Mallikarjunarao, ; Pradhan, K P; Sahu, P K is a scholarly article available to read on EtoBox.

Author

Ranjan, Rajeev; Mallikarjunarao, ; Pradhan, K P; Sahu, P K

Publisher

IOP Publishing; Institute of Physics Publishing (IOP) (ISSN 2043-6254)

Published

2016

Language

EN