About this scholarly article

2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - An area-efficient design for Programmable memory Built-In Self-Test by Chung-Fu Lin, ; Yeong-Jar Chang, is a scholarly article available to read on EtoBox.

Author

Chung-Fu Lin, ; Yeong-Jar Chang,

Publisher

IEEE

Published

2008