About this scholarly article

2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI) - Fine-Grained Multi-Instance Classification in Microscopy Through Deep Attention by Fan, Mengran; Chakraborti, Tapabrata; Chang, Eric I-Chao; Xu, Yan; Rittscher, Jens is a scholarly article available to read on EtoBox.

Author

Fan, Mengran; Chakraborti, Tapabrata; Chang, Eric I-Chao; Xu, Yan; Rittscher, Jens

Publisher

IEEE

Published

2020