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An experimental study of the electronic structure of anodically grown films on an amorphous Ni~78~Si~8~B~14~ alloy by S. Diplas; T. Knutsen; S. Jørgensen; A. E. Gunnæs; T. Våland; T. Norby; A. Olsen; J. Taftø is a Engineering article available to read on EtoBox.
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## Abstract Films of Ni(OH)~2~ and NiOOH grown on a rapidly solidified amorphous Ni~78~Si~8~B~14~ alloy by anodic polarisation were analysed with XPS and the results were compared with those of NiO and of films grown on polycrystalline Ni. SIMS performed on the polarised alloy showed enrichment of Ni at the outermost surface. Transmission electron microscopy (TEM) of cross‐sectional samples showed an absence of crystallinity. The Ni 2p shake up satellite and valence band spectra suggested that NiOOH is characterised by a more enhanced n‐type semi‐conducting behaviour compared to Ni(OH)~2~ in agreement with earlier tunnelling current density measurements performed with scanning tunnelling spectroscopy (STS). Copyright © 2008 John Wiley & Sons, Ltd.
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- Author
- S. Diplas; T. Knutsen; S. Jørgensen; A. E. Gunnæs; T. Våland; T. Norby; A. Olsen; J. Taftø
- Publisher
- John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Inc.; Wiley; Research Square (ISSN 0142-2421)
- Published
- 2008
- Language
- EN
- Field
- Engineering (Physical Sciences)