Opening book details…
About this Engineering article
A review of developments and applications of thin‐film microextraction coupled to surface‐enhanced Raman scattering by Cai, Lemei; Dong, Jing; Wang, Yiru; Chen, Xi is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Cai, Lemei; Dong, Jing; Wang, Yiru; Chen, Xi
- Publisher
- John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Ltd.; Wiley (ISSN 0173-0835)
- Published
- 2019
- Field
- Engineering (Physical Sciences)
More by Cai, Lemei; Dong, Jing; Wang, Yiru; Chen, Xi
Browse all works by Cai, Lemei; Dong, Jing; Wang, Yiru; Chen, Xi