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About this Engineering article
Study on Internal Stress in Micro-Electroformed Layer by Du, Li Qun; Tan, Zhi Cheng; Song, Chang; Zhao, Zhong; Li, Qing Feng; Yin, Peng He is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Du, Li Qun; Tan, Zhi Cheng; Song, Chang; Zhao, Zhong; Li, Qing Feng; Yin, Peng He
- Publisher
- Trans Tech Publications, Ltd.; Trans Tech Publications Ltd. (ISSN 1662-9795)
- Published
- 2015
- Language
- EN
- Field
- Engineering (Physical Sciences)