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About this Engineering article
Visualization of Defects on a Cultured Cell Layer by Utilizing Chemical Imaging Sensor by Miyamoto, Ko-ichiro; Bing, Yu; Wagner, Torsten; Yoshinobu, Tatsuo; Schöning, Michael J. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Miyamoto, Ko-ichiro; Bing, Yu; Wagner, Torsten; Yoshinobu, Tatsuo; Schöning, Michael J.
- Publisher
- Elsevier ; [Oxford]: Elsevier Ltd.; Elsevier BV (ISSN 1877-7058)
- Published
- 2015
- Field
- Engineering (Physical Sciences)