Opening book details…
About this book
Spectroscopic Characterization Techniques For Semiconductor Technology (proceedings Of Spie-the International Society For Optical Engineering Vol 452) by Fred H Pollak; Robert S Bauer; Society of Photo-optical Instrumentation Engineers is a book available to read on EtoBox.
- Author
- Fred H Pollak; Robert S Bauer; Society of Photo-optical Instrumentation Engineers
- Publisher
- Bellingham, Wash., USA: SPIE--the International Society for Optical Engineering
- Published
- 1984
- Language
- EN
- ISBN
- 9780892524877
- Subjects
- Science, Engineering, Physics
- Updated
- 2026-03-25
More by Fred H Pollak; Robert S Bauer; Society of Photo-optical Instrumentation Engineers
Similar books
- Laser Techniques For Surface Science 2 (proceedings Of Spie--the International Society For Optical Engineering, V. 2547.) — Janice M. Hicks, Wilson Ho, Hai-Lung Dai, chairs/editors; sponsored and published by SPIE--the International Society for Optical Engineering (1995)
- In-plane Semiconductor Lasers 3 (proceedings Of Spie--the International Society For Optical Engineering, V. 3628.) — Hong K. Choi, Peter S. Zory, chairs/editors; sponsored by SPIE--the International Society for Optical Engineering; cooperating organization, DARPA--Defense Advanced Research Projects Agency (1999)
- Proceedings of SPIE- The International Society for Optical Engineering Volume 275·Semiconductor Microlithography — Jim Dey (1981)
- Proceedings of the Society of photo-Optical Instrumentation Engineers Volume 276·Optical Characterization Techniques for Semiconductor Technology — D.E.Aspnes; S.So; R.F.Potter (1981)
- PROCEEDINGS OF SPIE-THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING VOLUME 297 EMERGING OPTICAL MATERIALS — Solomon Musikant; Society of Photo-optical Instrumentation Engineers; Aerospace Corporation; Conference on Emerging Optical Materials (1982)
- PROCEEDINGS OF SPIE-THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING VOLUME 323 SEMICONDUCTOR GROWTH TECHNOLOGY — Esther Krikorian, chairman/editor (1982)