About this scholarly article
2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Radiated reliability for 0.35μm SiGe BiCMOS technology by Wu, Xue; Cui, Wei; Zhu, Kunfeng; Yang, Yonghui; Tan, Kaizhou; Tang, Zhaohuan is a scholarly article available to read on EtoBox.
- Author
- Wu, Xue; Cui, Wei; Zhu, Kunfeng; Yang, Yonghui; Tan, Kaizhou; Tang, Zhaohuan
- Publisher
- IEEE
- Published
- 2017
- Language
- EN