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X-Ray Diffraction Quantitative Analysis Using Intensity Ratios and External Standards by Russ, John C.; Barrett, Charles S.; Predecki, Paul K.; Leyden, Donald E. is a scholarly article available to read on EtoBox.

What is X-Ray Diffraction Quantitative Analysis Using Intensity Ratios and External Standards about?

In alternating years, the Denver X-ray Conference turns its principal attention, through the choice of subjects for the plenary lectures, to various aspects of either X-ray fluorescence or dif fraction.

Author

Russ, John C.; Barrett, Charles S.; Predecki, Paul K.; Leyden, Donald E.

Publisher

Springer US : Imprint : Springer

Published

1982

Language

EN

ISBN

9781461399957