About this scholarly article
SPIE Proceedings [SPIE SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 9 July 1995)] Interferometry VII: Applications - Microstructural strain analysis by high-magnification moire interferometry by Huntley, Jonathan M.; Palmer, S. J. P.; Goldrein, Howell T.; Melin, L. Gunnar; Pryputniewicz, Ryszard J.; Brown, Gordon M.; Jueptner, Werner P. O. is a scholarly article available to read on EtoBox.
- Author
- Huntley, Jonathan M.; Palmer, S. J. P.; Goldrein, Howell T.; Melin, L. Gunnar; Pryputniewicz, Ryszard J.; Brown, Gordon M.; Jueptner, Werner P. O.
- Publisher
- SPIE
- Published
- 1995
- Language
- EN