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About this Engineering article
Modified Bayesian D-Optimality for Accelerated Degradation Test Design With Model Uncertainty by Yu, Yong; Hu, Changhua; Si, Xiaosheng; Zhang, Jianxun is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Yu, Yong; Hu, Changhua; Si, Xiaosheng; Zhang, Jianxun
- Publisher
- Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers Inc.; Institute of Electrical and Electronics Engineers (IEEE); Research Square (ISSN 2169-3536)
- Published
- 2019
- Field
- Engineering (Physical Sciences)
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