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About this Engineering article

New Trends in Intelligent System Design for Embedded and Measurement Applications by Alippi, C.; Ferrari, S.; Piuri, V.; Sami, M.; Scotti, F. is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Alippi, C.; Ferrari, S.; Piuri, V.; Sami, M.; Scotti, F.
Publisher
IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1094-6969)
Published
1999
Language
EN
Field
Engineering (Physical Sciences)

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