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About this Computer Science article
ESD Reliability Improvement of an HV nLDMOS by the Bulk FODs Engineering by Chen, Shen-Li; Lee, Min-Hua is a Computer Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Computer Science.
- Author
- Chen, Shen-Li; Lee, Min-Hua
- Publisher
- Elsevier ; Elsevier BV (ISSN 2212-6716)
- Published
- 2014
- Field
- Computer Science (Physical Sciences)