About this scholarly article

2014 IEEE 32nd VLSI Test Symposium (VTS) - Innovative practices session 7C: Reduced pin-count testing — How low can we go? by Sunter, Stephen; Comen, Steve; Berndt, Paul; Rajamani, Ram is a scholarly article available to read on EtoBox.

Author

Sunter, Stephen; Comen, Steve; Berndt, Paul; Rajamani, Ram

Publisher

IEEE

Published

2014

Language

EN