About this scholarly article

SPIE Proceedings [SPIE 3rd International Symposium on Advanced Optical Manufacturing and testing technologies: Optical test and Measurement Technology and Equipment - Chengdu, China (Sunday 8 July 2007)] 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Correlation function of angle-of-arrival… by Huang, Shengyang; Pan, Junhua; Wyant, James C.; Li, Wenyu; Zhou, Pu; Wang, Hexin; Geng, Yifeng is a scholarly article available to read on EtoBox.

Author

Huang, Shengyang; Pan, Junhua; Wyant, James C.; Li, Wenyu; Zhou, Pu; Wang, Hexin; Geng, Yifeng

Publisher

SPIE

Published

2007