About this scholarly article

SPIE Proceedings [SPIE OE/LASE'93: Optics, Electro-Optics, & Laser Applications in Science& Engineering - Los Angeles, CA (Sunday 17 January 1993)] Scanning Probe Microscopies II - Process and defect-induced surface morphology of relaxed GexSi1-x films by Hsu, Julia W. P.; Fitzgerald, Eugene A.; Xie, Ya-Hong; Silverman, Peter J.; Cardillo, Mark J.; Williams, Clayton C. is a scholarly article available to read on EtoBox.

Author

Hsu, Julia W. P.; Fitzgerald, Eugene A.; Xie, Ya-Hong; Silverman, Peter J.; Cardillo, Mark J.; Williams, Clayton C.

Publisher

SPIE

Published

1993