About this scholarly article

2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) - L2-Net: Deep Learning of Discriminative Patch Descriptor in Euclidean Space by Tian, Yurun; Fan, Bin; Wu, Fuchao is a scholarly article available to read on EtoBox.

Author

Tian, Yurun; Fan, Bin; Wu, Fuchao

Publisher

IEEE

Published

2017

Language

EN