About this scholarly article

Defect recombination induced by density-activated carrier diffusion in nonpolar InGaN quantum wells by Yang, Fan; Zhang, Chunfeng; Shi, Chentian; Joo Park, Min; Seop Kwak, Joon; Jung, Sukkoo; Choi, Yoon-Ho; Wu, Xuewei; Wang, Xiaoyong; Xiao, Min is a scholarly article available to read on EtoBox.

Author

Yang, Fan; Zhang, Chunfeng; Shi, Chentian; Joo Park, Min; Seop Kwak, Joon; Jung, Sukkoo; Choi, Yoon-Ho; Wu, Xuewei; Wang, Xiaoyong; Xiao, Min

Publisher

American Institute of Physics; AIP Publishing (ISSN 0003-6951)

Published

2013

Language

EN