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Can I read 2021 IEEE International Memory Workshop (IMW) on EtoBox?
2021 IEEE International Memory Workshop (IMW) by Okuno, Jun (author);Kunihiro, Takafumi (author);Konishi, Kenta (author);Maemura, Hideki (author);Shuto, Yusuke (author);Sugaya, Fumitaka (author);Materano, Monica (author);Ali, Tarek (author);Lederer, Maximilian (author);Kuehnel, Kati (author);Seidel, Konrad (author);Schroeder, Uwe (author);Mikolajick, Thomas (author);Tsukamoto, Masanori (author);Umebayashi, Taku (author) is a nonfiction available to read on EtoBox.
What is 2021 IEEE International Memory Workshop (IMW) about?
A novel 64 kbit one-transistor one-capacitor (1T1C) ferroelectric random access memory (FeRAM) array based on ferroelectric Hf0.5Zr0.5O2 (HZO) was proposed in a prior report. However, this array requires a low operation voltage for integration into advanced technology nodes, and its practical endurance remains unclear. To address these limitations, this study experimentally demonstrates the improved characteristics of a ferroelectric HfO2-based 1T1C FeRAM array. Thickness scaling of the ferroelectric HZO contributes to low-voltage operation of 1T1C FeRAMs, yielding 100% bit functionality at an operation voltage of 2.0 V and operating speed of 16 ns. Furthermore, the endurance performance of the 1T1C FeRAM memory array was investigated for the first time. Excellent cycling endurance (>10 8 cycles) at an accelerated stress voltage of 3.5 V at 85 °C was experimentally observed. The 1 ppm RBER at 2.0 V, 100 ns, and 85 °C operation was predicted to be >10 18 cycles, based on the dependence of time to breakdown on the stress voltage. This technology matches the requirements of last-level cache and low-power systems on chips for Internet of things applications.
Who reads 2021 IEEE International Memory Workshop (IMW)?
It is typically read by self-directed learners exploring a subject in depth.
Common subject areas: history, science, philosophy, social sciences.
- Author
- Okuno, Jun (author);Kunihiro, Takafumi (author);Konishi, Kenta (author);Maemura, Hideki (author);Shuto, Yusuke (author);Sugaya, Fumitaka (author);Materano, Monica (author);Ali, Tarek (author);Lederer, Maximilian (author);Kuehnel, Kati (author);Seidel, Konrad (author);Schroeder, Uwe (author);Mikolajick, Thomas (author);Tsukamoto, Masanori (author);Umebayashi, Taku (author)
- Publisher
- IEEE
- Published
- 2021
- Language
- EN
- Category
- nonfiction
More by Okuno, Jun (author);Kunihiro, Takafumi (author);Konishi, Kenta (author);Maemura, Hideki (author);Shuto, Yusuke (author);Sugaya, Fumitaka (author);Materano, Monica (author);Ali, Tarek (author);Lederer, Maximilian (author);Kuehnel, Kati (author);Seidel, Konrad (author);Schroeder, Uwe (author);Mikolajick, Thomas (author);Tsukamoto, Masanori (author);Umebayashi, Taku (author)
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