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FPGA Test Time Reduction Through A Novel Interconnect Testing Scheme by Cherupalli Akshitha is a document available to read on EtoBox.

What is FPGA Test Time Reduction Through A Novel Interconnect Testing Scheme about?

Testing cost is becoming a larger portion of the overall FPGA manufacturing cost. New testing architecture reduces switching matrix test time by 66% and diagnosis time by 72%. Our scheme can further help in improving yields, and reducing the costs even further.

Author

Cherupalli Akshitha

Language

EN